Photoelectron spectroscopy of ceria: Reduction, quantification and the myth of the vacancy peak in XPS analysis

Products / materials used
publication date
August 17, 2023
page number
1

Reference:

Morgan, D.J., 2023. Photoelectron spectroscopy of ceria: Reduction, quantification and the myth of the vacancy peak in XPS analysis. Surface and Interface Analysis, 55(11), pp.845-850.

PI-KEM Product referenced:

CeO2 Single Crystal

Abstract:

Primarily due to its inherent redox chemistry, ceria (CeO2) is of use in many diverse areas of research. However, there is a wealth of misinterpretation of the oxygen spectra when discussing the result of damage or reduction to the CeO2 lattice, especially with regard to a signal in this region attributed to oxygen vacancies. In this paper, it is shown that this peak cannot be due to vacancies and that a better understanding of the changes in stoichiometry of CeO2 is best viewed from that of the Ce(III) component when considered in tandem with the O 1s signal.

Authors:

David J. Morgan 1,2

Organisation / Department Address:

1 Max Planck-Cardiff Centre on the Fundamentals of Heterogeneous Catalysis, Cardiff Catalysis Institute, Translational Research Hub, Cardiff University, Cardiff, UK            2 HarwellXPS: The EPSRC National Facility for X-ray Photoelectron Spectroscopy, Research Complex at Harwell (RCaH), Didcot, UK